Interference and Diffraction
Phase Contrast and Differential Interference Contrast Microscopy
X-ray Crystallography
Interference: Path Lengths
IR Spectrometers
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Updated: May 18, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Yongzhao Du1, Guoying Feng, Hongru Li
1College of Electronic Information, Sichuan University, Chengdu, Sichuan 610064, China.
A novel point-diffraction interferometer offers a compact, vibration-insensitive design for measuring dynamic processes. Its common-path geometry simplifies alignment and enhances stability for optical testing.
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