X-ray Crystallography
Determination of Crystal Structures
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Updated: May 18, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Rajitha Papukutty Rajan1, Ambarish Ghosh
1Centre for Nano Science and Engineering, Indian Institute of Science, Bangalore, India. rajithapraj@gmail.com
Small beam deflections are amplified using light diffraction by a grating. This technique enhances detection limits in chiro-optical measurements by amplifying beam deviations from optically active media.
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