Chemical Ionization (CI) Mass Spectrometry
π Electron Effects on Chemical Shift: Overview
Mass Spectrum: Interpretation
Double Resonance Techniques: Overview
Tandem Mass Spectrometry
Mass Analyzers: Common Types
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Updated: May 18, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Yueming Zhou1, Cheng Huang, Peixiang Lu
1Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.
We investigated sequential double ionization (SDI) of Argon using a classical model. Our findings show multi-electron effects in ion momentum distributions, matching experimental data and revealing distinct photoelectron angular distributions.
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