X-ray Crystallography
Phase Contrast and Differential Interference Contrast Microscopy
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Updated: May 17, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Jorge Albero1, Ignacio Moreno, Jeffrey A Davis
1Dept. de Ciencia de Materiales, Óptica y Tecnología Electrónica, Universidad Miguel Hernández, 03202 Elche, Spain. j.albero@umh.es
Researchers created continuous phase masks to precisely control light diffraction patterns and intensities. This method was successfully demonstrated experimentally, enabling new applications in optics.
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