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Updated: May 15, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
Aberration-corrected echelle spectrometer for measuring ultraviolet branching fractions of iron-group ions
Michael P Wood1, James E Lawler
1Department of Physics, University of Wisconsin, 1150 University Avenue, Madison, Wisconsin 53706, USA. mpwood@wisc.edu
Abstract:
A high-resolution echelle spectrometer with broad wavelength coverage from the UV to the IR and high sensitivity to weak lines is described. Total instrument astigmatism is suppressed through rotation of the order separation system into an orthogonal plane. A suitable choice of mirror angles avoids increased coma. This spectrometer is used to record UV through IR spectra of Fe-group ions to measure improved branching fractions. These new results reduce transition probability uncertainties and yield more accurate derived stellar abundances. Instrument design and performance, including aberration compensation, are presented.
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