STEM_CELL: a software tool for electron microscopy: part 2--analysis of crystalline materials

Area of Science:

• Materials Science
• Electron Microscopy
• Image Analysis

Background:

• High-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy-high-angle annular dark-field (STEM-HAADF) are crucial for materials characterization.
• Existing software often lacks integrated analysis and simulation capabilities for advanced imaging techniques.
• Developing novel methodologies for quantitative and large-scale analysis is essential for deeper insights.

Purpose of the Study:

• Introduce STEM_CELL, a new graphical software for HRTEM and STEM-HAADF image analysis.
• Present novel analysis methodologies by integrating diverse algorithms and simulations.
• Highlight key methodological advancements in atomic-scale and large-region analysis.

Main Methods:

• Development of a user-friendly graphical software interface (STEM_CELL).
• Integration of various analysis algorithms and simulation tools.
• Implementation of improved image processing techniques including filtering, normalization, and background subtraction.

Main Results:

• A procedure for atomic-scale quantitative analysis of HAADF images has been established.
• Geometric phase analysis has been extended to analyze large regions (up to 1μm) using undersampled images.
• Novel analysis methodologies combining different algorithms and simulations are presented.

Conclusions:

• STEM_CELL provides a powerful and versatile platform for advanced electron microscopy image analysis.
• The software enables new possibilities for quantitative and large-scale materials characterization.
• The presented methodologies push the boundaries of current electron microscopy analysis techniques.