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Development of an ultra-high performance multi-turn TOF-SIMS/SNMS system "MULTUM-SIMS/SNMS"
Shingo Ebata1, Morio Ishihara, Kousuke Kumondai
1Department of Physics, Osaka University, Toyonaka, Japan. ebashin@ep.sci.hokudai.ac.jp
Journal of the American Society for Mass Spectrometry
|January 8, 2013
Summary
A novel time-of-flight mass spectrometry system with laser post-ionization significantly enhances metal ion detection sensitivity. This advanced system achieves high mass resolving power, ideal for analyzing valuable materials like space samples.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Conventional time-of-flight secondary ion mass spectrometry (TOF-SIMS) has limitations in sensitivity for certain materials.
- Laser post-ionization techniques offer potential for signal enhancement in mass spectrometry.
Purpose of the Study:
- To design and construct a novel system integrating multi-turn TOF-SIMS/SNMS with laser post-ionization.
- To evaluate the system's performance in terms of sensitivity and mass resolving power.
Main Methods:
- A system combining a gallium focused ion beam, femtosecond laser post-ionization, and a multi-turn TOF mass spectrometer was developed.
- The system was tested for analyzing metal samples, comparing results with conventional TOF-SIMS.
Main Results:
- Laser post-ionization increased secondary ion signal strengths for several metals by up to 650 times.
- The multi-turn mass spectrometer achieved a mass resolving power of 23,000 after 800 cycles (1040 m flight path).
Conclusions:
- The developed system demonstrates high sensitivity and high mass resolving power.
- This integrated system is highly effective for the sensitive analysis of valuable materials, including extraterrestrial samples, with high lateral resolution.
