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Updated: May 14, 2026
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A Mouse Ear Model for Allergic Contact Dermatitis Evaluation
Published on: March 24, 2023
North American Contact Dermatitis Group patch test results for 2007-2008
Anthony F Fransway1, Kathryn A Zug, Donald V Belsito
1afransway@associatesinderm.com
Dermatitis : Contact, Atopic, Occupational, Drug
|January 24, 2013
Summary
The North American Contact Dermatitis Group (NACDG) identified key allergens causing skin reactions in patients. Nickel, Myroxylon pereirae, and neomycin were most common, with changing trends in allergen sensitivity observed.
Area of Science:
- Dermatology
- Allergology
- Epidemiology
Background:
- The North American Contact Dermatitis Group (NACDG) regularly reports on screening allergen patch testing.
- This group aims to identify causes of allergic contact dermatitis.
Purpose of the Study:
- To report patch testing results from 2007-2008.
- To analyze trends in allergen sensitivity by comparing data from 2007-2008 with previous 2 and 10-year periods.
Main Methods:
- Standardized patch testing with 65 allergens was conducted at 13 North American centers.
- Chi-squared analysis was employed for statistical comparisons.
Main Results:
- 5085 patients were tested; 65.3% had at least one allergic reaction.
- Top allergens included nickel sulfate (19.5%), Myroxylon pereirae (11.0%), and neomycin (10.1%).
- Significant increases in nickel and methylchloroisothiazolinone/methylisothiazolinone sensitivity were noted, alongside decreases in many other allergens.
Conclusions:
- Periodic analysis of multicenter data tracks trends in allergen reactivity.
- This surveillance provides crucial information on clinically relevant allergens.
