Electrical impedance tomography reconstruction through simulated annealing with total least square error as objective

Thiago de Castro Martins1, Marcos de Sales Guerra Tsuzuki

  • 1Computational Geometry Laboratory, Escola Politécnica, São Paulo University, Brazil. thiago@usp.br

Summary

This study introduces a faster method for electrical impedance tomography (EIT) image reconstruction. It uses simulated annealing with partial objective function evaluations to reduce computational cost for improved EIT analysis.