A new standardized-automatic method for bone-to-implant contact histomorphometric analysis based on backscattered

Carolina Manresa1, Manel Bosch, María Cristina Manzanares

  • 1Departament d'Odontoestomatologia, Odontologia Integrada d'Adults, Facultat d'Odontologia, Universitat de Barcelona, Barcelona, Spain.

Summary

A new image analysis method using backscattered scanning electron microscopy (BS-SEM) provides a non-subjective way to measure bone-to-implant contact (BIC). This systematic approach offers more accurate and unbiased results compared to traditional methods.