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High-speed stroboscopic imaging with frequency-doubled supercontinuum.

Piotr Ryczkowski1, Anton Nolvi, Ivan Kassamakov

  • 1Department of Physics, Tampere University of Technology, Tampere, Finland. piotr.ryczkowski@tut.fi

Optics Letters
|March 5, 2013
PubMed
Summary
This summary is machine-generated.

We developed a cost-effective supercontinuum light source for dynamic white-light interferometry. This new system enables high-accuracy characterization of microelectromechanical systems oscillating at MHz frequencies.

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Published on: September 22, 2017

Area of Science:

  • Optics and Photonics
  • Microelectromechanical Systems (MEMS)

Background:

  • Stroboscopic white light interferometry requires advanced light sources for high-speed measurements.
  • Characterizing dynamic MEMS devices necessitates high temporal and spatial resolution.

Purpose of the Study:

  • To develop a compact and cost-effective supercontinuum light source for stroboscopic white light interferometry.
  • To enable dynamic characterization of rapidly oscillating objects at high frequencies.

Main Methods:

  • Construction of a supercontinuum (SC) light source using off-the-shelf optical components.
  • Operation across visible and near-infrared spectra with adjustable repetition rates (10 kHz–1 MHz).
  • Application in dynamic white-light interferometry for motion analysis.

Main Results:

  • The SC source operates at arbitrary repetition rates within the 10 kHz–1 MHz range.
  • The system is estimated to support dynamic interferometric characterization of objects oscillating up to several tens of megahertz.
  • Demonstrated sub-100 nm accuracy in capturing a microelectromechanical system oscillating at 2.16 MHz.

Conclusions:

  • The developed supercontinuum light source is suitable for stroboscopic white light interferometry.
  • This technology facilitates high-accuracy, dynamic characterization of high-frequency oscillating MEMS devices.
  • The compact and cost-effective design promotes broader accessibility for advanced optical metrology.