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Updated: May 13, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Facility implementation and comparative performance evaluation of probe-corrected TEM/STEM with Schottky and cold

Yan Xin1, John Kynoch, Ke Han

  • 1National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32310, USA. xin@magnet.fsu.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 6, 2013
PubMed

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