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Updated: May 12, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
David J Bowman1, Malcolm J King, Andrew J Sutton
1Department of Quantum Science, College of Physical and Mathematical Sciences, Australian National University, Acton, Australia.
This study presents a novel method for optical phased arrays, eliminating the need for external components. It uses pseudo-random noise phase modulation and heterodyne interferometry to actively stabilize optical path lengths against disturbances.
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06:55Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses
Published on: June 6, 2017
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