Confocal Fluorescence Microscopy
Phase Contrast and Differential Interference Contrast Microscopy
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
David T Lloyd1, Kevin O'Keeffe, Simon M Hooker
1Department of Physics, University of Oxford, Clarendon Laboratory, Oxford, UK. d.lloyd1@physics.ox.ac.uk
A new method measures optical wavefronts using interference patterns from scanning and static slits. This technique characterizes high harmonic radiation and can be applied to diverse light sources.
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