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Interface characterization of B4C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering.

Hui Jiang1, Zhanshan Wang, Jingtao Zhu

  • 1Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai, People's Republic of China. jianghui@sinap.ac.cn

Journal of Synchrotron Radiation
|April 18, 2013
PubMed
Summary

Tungsten/Boron Carbide (W/B4C) multilayers exhibit superior structural stability and sharper interfaces compared to Molybdenum/Boron Carbide (Mo/B4C) and Lanthanum/Boron Carbide (La/B4C) multilayers. This research guides future multilayer fabrication and characterization for X-ray applications.

Keywords:
X-ray reflectivityagingboron carbidediffuse scatteringinterfacemultilayer

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