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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Sample Preparation for Analysis: Advanced Techniques01:08

Sample Preparation for Analysis: Advanced Techniques

Accurate analysis of complex samples often requires advanced preparation techniques to achieve reliable and reproducible results. Samples containing inorganic or organic materials can be challenging to dissolve or decompose effectively. Standard sample preparation methods include acid digestion, fusion, dry ashing, and wet digestion.
Acid digestion with strong acids is commonly used to dissolve inorganic materials that are insoluble (do not dissolve) in water. This method can be useful for...

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Related Experiment Video

Updated: May 11, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

Applying computational geometry techniques for advanced feature analysis in atom probe data.

Peter Felfer1, Anna Ceguerra, Simon Ringer

  • 1Australian Centre for Microscopy and Microanalysis, The University of Sydney, Madsen Building F09, NSW 2006, Camperdown, Australia.

Ultramicroscopy
|April 30, 2013
PubMed
Summary
This summary is machine-generated.

New atom probe tomography methods enhance materials characterization by analyzing features using Voronoi subvolumes and distance to center of mass (DCOM). These techniques enable detailed analysis of dislocations and interfacial excess in quantum dots.

Keywords:
Atom probe tomographyData analysisInterfacial excessInterfacial excess mappingProxigram

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Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
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Last Updated: May 11, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
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Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
09:51

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries

Published on: April 22, 2013

Area of Science:

  • Materials Science
  • Nanotechnology
  • Data Analysis

Background:

  • Atom probe tomography (APT) is a powerful technique for 3D materials characterization at the atomic scale.
  • Analyzing complex APT datasets to extract meaningful material information, such as feature delineation and quantification, remains challenging.
  • Existing methods may not fully capture the intricacies of various material features like dislocations or interfaces.

Purpose of the Study:

  • To introduce novel feature analysis methods for atom probe tomography data.
  • To demonstrate the utility of these methods in materials characterization.
  • To enable advanced analysis of specific material features like dislocations and interfaces.

Main Methods:

  • Development of analysis techniques based on Voronoi subvolumes and piecewise linear approximations.
  • Feature delineation using the distance to the center of mass (DCOM) of subvolumes.
  • Application of coordinate systems derived from these approximations for analysis.

Main Results:

  • Successful application of new methods for analyzing line-like objects, such as dislocations, using proxigrams and line-excess plots.
  • Demonstration of interfacial excess mapping for an Indium Gallium Arsenide (InGaAs) quantum dot.
  • Validation of the proposed methods for detailed materials characterization.

Conclusions:

  • The presented methods offer advanced capabilities for feature analysis in atom probe tomography.
  • These techniques provide valuable insights into material structures, including dislocations and interfaces.
  • The developed approach enhances the application of APT in materials science and nanotechnology.