Transit phenomena in organic field-effect transistors through Kelvin-probe force microscopy

Christian Melzer1, Christopher Siol, Heinz von Seggern

  • 1Ruprecht-Karls-Universität Heidelberg, Centre for Advanced Materials, Im Neuenheimer Feld 270, 69120 Heidelberg, Germany. christian.melzer@kip.uni-heidelberg.de

Summary

Investigating pentacene field-effect transistors reveals how surface potential changes during charge reversal. This allows for precise measurement of carrier density and electric field dependent hole mobility in the sub-threshold regime.