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Optimization of low-background alpha spectrometers for analysis of thick samples

M Misiaszek1, K Pelczar, M Wójcik

  • 1M. Smoluchowski Institute of Physics, Jagiellonian University, Reymonta 4, PL-30-059 Kraków, Poland.

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine
|May 1, 2013
PubMed

Keywords:
Alpha spectroscopyLow-background measurementsSurface screeningThick samples

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