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Related Experiment Video

Updated: May 11, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Interaction forces between silica surfaces in cationic surfactant solutions: an atomic force microscopy study.

Liset A C Lüderitz¹, Regine v Klitzing

¹Stranski-Laboratorium für Physikalische und Theoretische Chemie, Institut für Chemie, Technische Universität Berlin, Berlin, Germany.

Journal of Colloid and Interface Science

|May 8, 2013

Summary

Surfactant solutions alter silicon oxide surface forces. Different aggregate structures on silica particles and wafers influence interactions, with varying points of zero charge indicating distinct surface charges.

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Last Updated: May 11, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

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Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

Published on: July 18, 2014

Area of Science:

Surface Science
Colloid and Interface Science
Materials Chemistry

Background:

Understanding interactions between silicon oxide surfaces is crucial in various applications.
Surfactant solutions significantly influence surface forces and aggregate formation.
The morphology of surface aggregates affects macroscopic properties.

Purpose of the Study:

To investigate the interaction forces between silicon oxide surfaces in surfactant solutions.
To correlate these forces with the structure of surface aggregates.
To analyze the influence of surfactant concentration on surface properties.

Main Methods:

Utilized colloidal probe atomic force microscopy (AFM) to measure forces.
Studied interactions between silica particles and between silica particles and silicon wafers.
Employed hexadecyltrimethylammonium bromide (CTAB) at varying concentrations (0.005 mM to 1.2 mM).

Main Results:

Observed distinct interaction forces for silica particle-silica particle versus silica particle-silicon wafer systems.
Identified different aggregate morphologies on silica particles and silicon wafers.
Determined the point of zero charge (pzc) at 0.05 mM CTAB for silica particles and 0.3 mM for the silica particle-silicon wafer system.
Noted higher surface charge on the silicon wafer compared to silica particles.

Conclusions:

Silica particles and silicon wafers exhibit different surface aggregate structures.
The silicon wafer possesses a higher surface charge than the silica particles under the studied conditions.
Long-range attractions may arise from surface nanobubbles or attractive electrostatic interactions due to oppositely charged patches.