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Limits of simulation based high resolution EBSD.

Jon Alkorta1

  • 1CEIT and Tecnun (University of Navarra), Manuel de Lardizábal 15, 20018 San Sebastián, Spain. jalkorta@ceit.es

Ultramicroscopy
|May 17, 2013
PubMed
Summary
This summary is machine-generated.

High resolution electron backscattered diffraction (HREBSD) can determine crystal orientation and stress. However, phantom stresses arise from pattern center calibration issues, making absolute stress determination unfeasible with a single detector.

Keywords:
CalibrationEBSDElectron backscatter diffractionElectron diffractionScanning electron microscopeStrain

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Area of Science:

  • Crystallography
  • Materials Science
  • Solid Mechanics

Background:

  • High resolution electron backscattered diffraction (HREBSD) is a technique for determining crystal orientation and stress.
  • Recent studies attempt to determine absolute crystal orientation and stress using simulated electron backscattered diffraction (EBSD) patterns.
  • Precise calibration of the pattern center is crucial to prevent phantom stresses.

Purpose of the Study:

  • To analyze the geometrical origins of phantom stresses in HREBSD.
  • To investigate the feasibility of determining absolute crystal stress states using HREBSD.

Main Methods:

  • Geometrical analysis of the projective transformation in EBSD pattern formation.
  • Numerical simulations to confirm the geometrical analysis.

Main Results:

  • Phantom stresses are linked to specific combinations of crystal strain states and pattern center locations.
  • Certain strain states and locations produce nearly identical EBSD patterns, creating ambiguity.
  • This ambiguity renders the absolute stress state determination unfeasible in a single-detector setup.

Conclusions:

  • Understanding the geometrical basis of phantom stresses is essential for accurate HREBSD analysis.
  • The inherent ambiguity in EBSD pattern interpretation limits the determination of absolute crystal stress states.
  • Future research may require multi-detector configurations or complementary techniques for absolute stress determination.