Electron-ion coupling effects on radiation damage in cubic silicon carbide

Chao Zhang1, Fei Mao, Feng-Shou Zhang

  • 1The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, People's Republic of China.

Summary

Electron-ion coupling significantly impacts defect formation in irradiated silicon carbide. Intermediate coupling enhances defect creation, while strong coupling reduces it by dissipating cascade energy.

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