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Updated: May 11, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

Tip apex shaping of gas field ion sources

Jason L Pitters1, Radovan Urban, Cristian Vesa

  • 1National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada. jason.pitters@nrc-cnrc.gc.ca

Ultramicroscopy
|May 21, 2013
PubMed

Keywords:
Field ion microscopyGas field ion sourceHelium

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