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Updated: May 11, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Preparation of samples with both hard and soft phases for electron backscatter diffraction: examples from gold
Angela Halfpenny1, Robert M Hough, Michael Verrall
1CSIRO Earth Science and Resource Engineering, Minerals Down Under Flagship, ARRC, 26 Dick Perry Avenue, Kensington, WA 6151, Australia. angela.halfpenny@csiro.au
High-quality sample polishing for mineral and alloy microanalysis is crucial. Combining chemical-mechanical polishing (CMP) with broad ion-beam polishing (BIBP) effectively prepares diverse ore samples, enabling accurate texture quantification.
Area of Science:
- Materials Science
- Geology
- Analytical Chemistry
Background:
- High-quality sample surfaces are essential for microanalytical data collection.
- The
- beilby
- layer on gold and mixed hard-soft phases in ores complicate sample preparation.
Purpose of the Study:
- To develop a method for preparing polished sample surfaces on all mineral phases for electron backscatter diffraction analysis.
- To overcome challenges in preparing ore samples with both hard and soft mineral phases.
Main Methods:
- A combination of chemical-mechanical polishing (CMP) and broad ion-beam polishing (BIBP) was employed.
- The sequence of CMP followed by BIBP was investigated.
Main Results:
- CMP effectively polishes hard mineral phases but can damage soft surfaces.
- BIBP is critical for achieving a high-quality polish on soft phases, such as gold.
- The combined CMP and BIBP method successfully prepared samples containing diverse mineral phases.
Conclusions:
- Performing CMP before BIBP is critical for optimal sample preparation.
- This efficient method allows for the complete quantification of ore textures and all constituent mineral phases, including soft alloys.
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