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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Double Resonance Techniques: Overview01:12

Double Resonance Techniques: Overview

Double resonance techniques in Nuclear Magnetic Resonance (NMR) spectroscopy involve the simultaneous application of two different frequencies or radiofrequency pulses to manipulate and observe two distinct nuclear spins. One important application of double resonance is spin decoupling, which selectively suppresses coupling with one type of nucleus while observing the NMR signal from another nucleus, simplifying the spectrum and enhancing resolution.
Spin decoupling is usually achieved by...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Related Experiment Video

Updated: May 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Contrast in atomically resolved EF-SCEM imaging.

Peng Wang1, Adrian J D'Alfonso, Ayako Hashimoto

  • 1National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, People's Republic of China.

Ultramicroscopy
|July 31, 2013
PubMed
Summary
This summary is machine-generated.

Energy-filtered scanning confocal electron microscopy (EF-SCEM) provides 3D compositional data with lattice resolution. This technique shows a confocal effect distinct from STEM, with simulations aiding data interpretation.

Keywords:
Energy-filtered imagingOptical sectioningScanning confocal electron microscopy

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Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography
08:15

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography

Published on: June 9, 2018

Related Experiment Videos

Last Updated: May 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography
08:15

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography

Published on: June 9, 2018

Area of Science:

  • Materials Science
  • Microscopy Techniques
  • Nanotechnology

Background:

  • Aberration-corrected transmission electron microscopy enables advanced imaging.
  • 3D compositional mapping is crucial for nanoscale materials analysis.
  • Confocal microscopy principles can be adapted for electron microscopy.

Purpose of the Study:

  • To demonstrate the capabilities of energy-filtered scanning confocal electron microscopy (EF-SCEM).
  • To achieve lattice resolution in 3D compositional imaging.
  • To explore the confocal effect and data interpretability in EF-SCEM.

Main Methods:

  • Utilizing an aberration-corrected transmission electron microscope in scanning confocal mode.
  • Employing energy filtering for compositional contrast.
  • Recording image data from a silicon sample in the <110> orientation.
  • Performing simulations to validate experimental results and explore data interpretation.

Main Results:

  • Achieved lattice resolution in the plane perpendicular to the incident beam.
  • Demonstrated a confocal effect characterized by reduced mean intensity with plane displacement.
  • Simulations showed good agreement with experimental EF-SCEM data.
  • Identified channelling, absorption, and delocalization as factors affecting data interpretation.
  • Observed that increasing aperture size makes EF-SCEM contrast resemble STEM spectrum imaging.

Conclusions:

  • EF-SCEM is a viable technique for 3D compositional analysis with high spatial resolution.
  • The confocal effect in EF-SCEM differs from optical sectioning in STEM.
  • Accurate interpretation of EF-SCEM data requires matching with simulations.
  • The detector aperture size influences the final image contrast and similarity to STEM spectrum imaging.