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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Published on: April 1, 2020

Phase-tilting interferometry for optical testing.

Jianxin Li1, Rihong Zhu, Lei Chen

  • 1School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing, China. ljx@vip.163.com

Optics Letters
|August 2, 2013
PubMed
Summary
This summary is machine-generated.

This study introduces phase-tilting interferometry to accurately retrieve phase information from optical testing interferograms, even with random tilts. The method offers high accuracy and robustness for precise measurements, even without a phase shifter.

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Area of Science:

  • Optical Engineering
  • Metrology
  • Image Processing

Background:

  • Interferometry is crucial for optical testing but is sensitive to random phase tilts.
  • Existing methods often require phase shifters or struggle with environmental vibrations.

Purpose of the Study:

  • To develop a novel phase retrieval method for interferograms with random phase tilts.
  • To enhance the accuracy and robustness of interferometric measurements.
  • To enable high-precision analysis without phase shifters.

Main Methods:

  • Phase-tilting interferometry is proposed.
  • The Radon transform is utilized to extract the tilted phase plane.
  • Least squares method is employed for phase distribution retrieval.

Main Results:

  • Satisfactory results were obtained for both simulated and experimental interferograms.
  • The method demonstrates high accuracy and good robustness.
  • Successful application in environments with vibrations was shown.

Conclusions:

  • The proposed phase-tilting interferometry effectively retrieves phase from tilted interferograms.
  • This technique provides a robust solution for optical testing and interferometric measurements.
  • It enables high-precision analysis, even in challenging conditions and without phase shifters.