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Logarithmic axicon characterized by scanning optical probe system.

Zhaolou Cao¹, Keyi Wang, Qinglin Wu

¹Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China.

|August 14, 2013

Summary

This summary is machine-generated.

A novel scanning optical probe system measures logarithmic axicons with subwavelength resolution. This method accurately determines the phase retardation function for quasi-nondiffracting beams.

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Area of Science:

Optical Metrology
Nanotechnology
Beam Optics

Background:

Logarithmic axicons (LAs) are optical elements that generate unique beam profiles.
Accurate characterization of LAs is crucial for their application in advanced optical systems.
Subwavelength resolution measurements present significant metrological challenges.

Purpose of the Study:

To propose and experimentally validate a scanning optical probe system for measuring logarithmic axicons.
To achieve subwavelength resolution in characterizing the phase retardation function (PRF) of LAs.
To enable precise calculation of optical path differences for generated beams.

Main Methods:

Utilizing a scanning optical probe system to capture multiple plane intensity profiles.
Employing an optimization problem to interpret the measured intensity data.
Solving for the phase retardation function (PRF) of the logarithmic axicon.

Main Results:

The proposed system successfully measured the PRF of a logarithmic axicon with high accuracy.
Subwavelength resolution was demonstrated in the characterization process.
The calculated optical path difference of the quasi-nondiffracting beam was validated.

Conclusions:

The scanning optical probe system offers a viable method for subwavelength metrology of logarithmic axicons.
Accurate PRF determination is essential for understanding and utilizing the properties of generated quasi-nondiffracting beams.
This technique advances the field of optical metrology for complex optical elements.