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Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Akihisa Takeuchi1, Kentaro Uesugi, Yoshio Suzuki
1Research and Utilization Division, Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Sayo-gun, Hyogo 679-5198, Japan. take@spring8.or.jp
A novel three-dimensional (3D) X-ray tomographic micro-imaging system, the scanning-imaging X-ray microscope (SIXM), has been developed. This system enables quantitative 3D imaging with flexible contrast modes after data acquisition.
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