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Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Direct detection of electron backscatter diffraction patterns.

Angus J Wilkinson1, Grigore Moldovan, T Benjamin Britton

  • 1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.

Physical Review Letters
|August 27, 2013
PubMed
Summary
This summary is machine-generated.

Direct detection technology enhances electron backscatter diffraction pattern analysis, revealing finer details and enabling measurements at lower beam energies for advanced materials characterization.

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Electron backscatter diffraction (EBSD) is a crucial technique for analyzing crystal structures and orientations in materials.
  • Conventional detectors in EBSD have limitations in resolution and operational energy ranges.
  • Accurate strain mapping requires high-precision measurements of pattern shifts.

Purpose of the Study:

  • To introduce and evaluate direct detection for electron backscatter diffraction pattern acquisition.
  • To demonstrate the advantages of direct detection over conventional methods.
  • To validate the underlying physics of direct detection through simulation.

Main Methods:

  • Utilizing direct detection technology for recording electron backscatter diffraction patterns.
  • Comparing pattern resolution and visibility of higher-order features with conventional detectors.
  • Assessing the feasibility of measurements at low primary electron beam energies.
  • Performing cross-correlation based pattern shift measurements for strain analysis.
  • Generating simulated patterns based on the physics of direct detection to verify experimental data.

Main Results:

  • Direct detection reveals higher-order features in EBSD patterns, improving resolution.
  • Patterns can be successfully recorded at lower beam energies than with conventional detectors.
  • High precision in pattern shift measurements is achievable, suitable for high-resolution strain mapping.
  • Simulated patterns accurately verify experimental data, confirming the understanding of low-energy electron physics.

Conclusions:

  • Direct detection offers significant advantages for electron backscatter diffraction, including enhanced resolution and lower energy operation.
  • This technique enables more precise strain mapping and provides a robust method for data validation through simulation.
  • Direct detection represents a significant advancement in electron microscopy for materials characterization.