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Updated: May 8, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
A V Matetskiy1, L V Bondarenko, D V Gruznev
1Institute of Automation and Control Processes FEB RAS, 690041 Vladivostok, Russia. School of Natural Sciences, Far Eastern Federal University, 690950 Vladivostok, Russia.
Adsorbing C₆₀ fullerenes onto lead (Pb) films on silicon (Si) surfaces causes structural transformations. C₆₀ islands expel Pb atoms, driving rapid, correlated atomic motion, not random diffusion.
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