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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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HOLZ rings in EBSD patterns of the UFeB₄ compound: association with a random distribution of planar defects

Marta Dias1, Patrícia Almeida Carvalho, Isabel Cordeiro Dos Santos

  • 1IST/ITN, Instituto Superior Técnico, University of Lisbon, Estrada Nacional 10, 2686-953 Sacavém, Portugal.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 18, 2013
PubMed

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