Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Direct-write 3D nanolithography at cryogenic temperatures.

Nanotechnology·2012
Same author

A survey of equine abortion, stillbirth and neonatal death in the UK from 1988 to 1997.

Equine veterinary journal·2003
Same author

What are the health hazards of snowboarding?

The Western journal of medicine·2001
Same author

Substitution rates in Drosophila nuclear genes: implications for translational selection.

Genetics·2001
Same author

The downside of adolescent employment: hazards and injuries among working teens in North Carolina.

Journal of adolescence·2000
Same author

Rates of nucleotide substitution and mammalian nuclear gene evolution. Approximate and maximum-likelihood methods lead to different conclusions.

Genetics·2000
Same journal

Quantitative analysis of light-induced ion segregation in mixed-halide perovskites.

Journal of applied crystallography·2026
Same journal

Towards machine-learning-based on-the-fly analysis of neutron reflectometry.

Journal of applied crystallography·2026
Same journal

<i>mcstas_gisans</i>: combining ray tracing with the distorted-wave Born approximation using <i>McStas</i> and <i>BornAgain</i> for virtual GISANS experiments.

Journal of applied crystallography·2026
Same journal

Computational methods for automated center determination in electron diffraction patterns.

Journal of applied crystallography·2026
Same journal

Epitaxy of ultrathin Fe<sub>3</sub>O<sub>4</sub> films on SrTiO<sub>3</sub>(001): influence of growth parameters on the formation of coexisting (111)- and (001)-oriented phases.

Journal of applied crystallography·2026
Same journal

Spin excitations near the pressure-induced antiferromagnetic transition in SrCu<sub>2</sub>(BO<sub>3</sub>)<sub>2</sub>.

Journal of applied crystallography·2026
See all related articles

Related Experiment Video

Updated: May 7, 2026

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy
06:37

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy

Published on: June 15, 2022

Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures.

P K Shreeman1, K A Dunn, S W Novak

  • 1College of Nanoscale Science and Engineering, University at Albany-SUNY , 257 Fuller Road, Albany, NY 12203, USA.

Journal of Applied Crystallography
|September 19, 2013
PubMed
Summary
This summary is machine-generated.

A modified statistical dynamical diffraction theory (mSDDT) accurately analyzes X-ray diffraction scans for thin films. This advanced method provides structural insights for materials ranging from defect-free to those with increasing defects.

Keywords:
defective semiconductor heterostructuresstatistical dynamical diffraction theory

More Related Videos

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
06:49

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
06:57

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

Published on: July 17, 2020

Related Experiment Videos

Last Updated: May 7, 2026

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy
06:37

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy

Published on: June 15, 2022

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
06:49

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
06:57

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

Published on: July 17, 2020

Area of Science:

  • Materials Science
  • Solid State Physics
  • Crystallography

Background:

  • X-ray diffraction (XRD) is crucial for characterizing thin-film materials.
  • Existing dynamical diffraction theories have limitations in analyzing the full spectrum of thin-film behavior.
  • Accurate structural analysis of thin films is vital for device performance and material development.

Purpose of the Study:

  • To introduce and validate a modified statistical dynamical diffraction theory (mSDDT) for comprehensive thin-film analysis.
  • To assess the capability of mSDDT in handling the transition from dynamic to kinematic scattering regimes.
  • To demonstrate mSDDT's utility in extracting structural information from SiGe/Si thin-film systems.

Main Methods:

  • Development of a modified statistical dynamical diffraction theory (mSDDT).
  • Application of mSDDT to high-resolution X-ray diffraction scans of SiGe/Si thin-film samples.
  • Comparison of mSDDT results with established dynamical diffraction simulation software.

Main Results:

  • mSDDT successfully performs full-pattern fitting across the dynamic-to-kinematic scattering range.
  • For defect-free, dynamic limit samples, mSDDT results align with commercial dynamical diffraction software.
  • mSDDT reveals new structural insights for materials with increasing defect levels, shifting towards the kinematic limit.

Conclusions:

  • mSDDT is a versatile and powerful tool for analyzing X-ray diffraction data from thin films.
  • The theory bridges the gap between dynamic and kinematic scattering, offering a unified approach.
  • mSDDT enhances the understanding of structural characteristics in imperfect thin-film systems.