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xrayutilities: a versatile tool for reciprocal space conversion of scattering data recorded with linear and area

Dominik Kriegner1, Eugen Wintersberger, Julian Stangl

  • 1Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstrasse 69, A-4040 Linz, Austria.

Journal of Applied Crystallography
|September 19, 2013
PubMed

Keywords:
X-ray scatteringcomputer programsdata analysisreciprocal space

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