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Updated: May 7, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction
Sukswat Jongsukswat1, Tomoe Fukamachi, Dongying Ju
1Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan.
Abstract:
In X-ray interference fringes accompanied by mirage diffraction, variations have been observed in the spacing and position of the fringes from a plane-parallel Si single crystal fixed at one end as a function of distance from the incident plane of the X-rays to the free crystal end. The variations can be explained by distortion of the sample crystal due to gravity. From the variations and positions of the fringes, the strain gradient of the crystal has been determined. The distribution of the observed strain agrees with that expected from rod theory except for residual strain. When the distortion is large, the observed strain distribution does not agree with that expected from rod theory.
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