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[Correction method for infrared spectral emissivity measurement system based on integrating sphere reflectometer].
Yu-Feng Zhang1, Jing-Min Dai, Yu Zhang
1School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin 150001, China. zyf81@aliyun.com
Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|October 29, 2013
Summary
This study introduces a calibration method to improve spectral emissivity measurements. The technique corrects for errors caused by non-ideal reference standards, enhancing measurement accuracy.
Area of Science:
- Infrared spectroscopy
- Optical metrology
- Materials science
Context:
- Spectral emissivity measurements are crucial for applications in thermal management and remote sensing.
- Integrating sphere reflectometers are commonly used for emissivity measurements.
- Non-ideal reference standards introduce significant errors in these measurements.
Purpose:
- To propose and validate a calibration method for spectral emissivity measurements using reflection techniques.
- To address the impact of non-ideal reference standards on measurement accuracy.
- To improve the reliability of infrared emissivity data.
Summary:
- A novel calibration method was developed for spectral emissivity measurement systems utilizing integrating sphere reflectometers.
- The method involves fitting a reference standard's spectral reflectance curve to compute a correction coefficient.
- This coefficient is applied to correct the system's output voltage, effectively eliminating errors from imperfect standards.
Impact:
- The developed correction method significantly improves the accuracy of spectral emissivity measurements.
- Validation through comparison with energy comparison methods confirms the technique's feasibility and effectiveness.
- This advancement provides more reliable spectral emissivity data for scientific and industrial applications.
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