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Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts

M J Eller1, S V Verkhoturov, F A Fernandez-Lima

  • 1Department of Chemistry, Texas A&M University, College Station, TX, 77842-3012, USA.

Surface and Interface Analysis : SIA
|October 29, 2013
PubMed

Keywords:
Cluster SIMSElectron EmissionElectron Emission MicroscopeLocalization

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