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SIMS instrumentation and methodology for mapping of co-localized molecules
M J Eller1, S V Verkhoturov, S Della-Negra
1Department of Chemistry, Texas A&M University, College Station, Texas 77843-3144, USA.
The Review of Scientific Instruments
|November 5, 2013
Summary
This study presents a new method for precisely locating surface molecules using electron emission microscopy and mass spectrometry. This technique achieves localization within 1-2 micrometers, revealing co-located molecules at the nanoscale.
Area of Science:
- Surface science
- Analytical chemistry
- Microscopy
Background:
- Accurate localization of surface molecules is crucial for understanding chemical processes.
- Existing methods may lack the resolution or specificity required for nanoscale analysis.
Purpose of the Study:
- To introduce and validate an innovative methodology for localizing individual surface molecule impacts.
- To demonstrate the capability of generating high-resolution ion maps of surface species.
Main Methods:
- Utilizing 50 keV C60 impacts for molecular localization.
- Synchronizing an electron emission microscope (EEM) with a time-of-flight mass spectrometer.
- Developing instrumentation and software for generating precise ion maps.
Main Results:
- Successfully localized individual C60 impact sites within 1-2 μm.
- Generated analyte-specific maps and maps of co-emitted species.
- Identified co-emitted ions originating from molecules co-located within ~10 nm.
Conclusions:
- The described methodology offers a novel and effective approach for high-resolution surface molecule localization.
- The technique enables the identification of nanoscale co-localization of molecules through the analysis of individual impacts.
