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Summary

This summary is machine-generated.

Surface plasmon microscopy now images microscale structures by exciting guided waves. This technique quantifies layer refractive index and thickness with high spatial resolution.

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Area of Science:

Optics and Photonics
Materials Science
Surface Science

Background:

Surface plasmon microscopy offers high sensitivity for nanoscale structures near gold surfaces.
Coupling with high-numerical-aperture objectives improved resolution to the diffraction limit.

Purpose of the Study:

To demonstrate that scanning surface plasmon microscopy can image microscale structures.
To extend the application range of surface plasmon microscopy to microscale imaging.
To develop a method for extracting optical properties of dielectric layers.

Main Methods:

Utilizing a scanning surface plasmon microscope with high-numerical-aperture objectives.
Exciting standing guided waves in asymmetric slabs.
Fourier transforming the V(Z) response to obtain the reflectivity curve R(ν).

Main Results:

Demonstrated excitation of standing guided waves in asymmetric slabs using the microscope.
Observed sharp peaks in R(ν) corresponding to quantified guiding modes.
Successfully extracted refractive index (RI) and thickness of PPMA films.

Conclusions:

The surface plasmon microscope configuration can image microscale structures by exciting guided waves.
Refractive index and thickness contours of dielectric samples can be reconstructed with high spatial resolution.
This method expands the utility of surface plasmon microscopy for microscale analysis.