Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.1K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.1K
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

3.1K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
3.1K
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

1.1K
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
1.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Crystallographically controlled alignment of melt inclusion entrapment in magmatic olivine: Insights from Lab-Diffraction Contrast Tomography.

Micron (Oxford, England : 1993)·2026
Same author

Navigating the unavoidable: Enhancing the EBSD indexability through adaptation to three hurdles in femtosecond laser ablation.

Ultramicroscopy·2026
Same author

Revealing Nanoscale Solute-Rich Clusters in Bulk Metallic Glasses by Atom Probe Tomography.

Small methods·2025
Same author

On-Tip Polymerization Method for Multimodal Characterization of Nanoparticles with Electron/Ion Imaging and Atom Probe Tomography.

Small methods·2025
Same author

Vortices and antivortices in antiferroelectric PbZrO<sub>3</sub>.

Nature materials·2025
Same author

The Australian National Total-Body PET Facility-A Shared Resource and Risk Model for Implementing Total-Body PET.

Journal of nuclear medicine : official publication, Society of Nuclear Medicine·2025
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
Same journal

Temperature-dependent mean inner potential of polystyrene spheres measured using off-axis electron holography.

Ultramicroscopy·2026
See all related articles

Related Experiment Video

Updated: May 5, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

14.8K

An automated method of quantifying ferrite microstructures using electron backscatter diffraction (EBSD) data.

Sachin L Shrestha1, Andrew J Breen2, Patrick Trimby2

  • 1School of Aerospace, Mechanical and Mechatronic Engineering, The University of Sydney, NSW 2006, Australia.

Ultramicroscopy
|December 3, 2013
PubMed
Summary
This summary is machine-generated.

A new automated technique using electron backscatter diffraction (EBSD) accurately identifies and quantifies ferrite microstructures in steel. This method overcomes the challenges of manual point counting, offering a faster and less biased approach for materials characterization.

Keywords:
Data analysisElectron backscatter diffractionHSLA steelNiobium

More Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.4K
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

5.8K

Related Experiment Videos

Last Updated: May 5, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

14.8K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.4K
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

5.8K

Area of Science:

  • Materials Science
  • Metallurgy
  • Microscopy

Background:

  • Identifying and quantifying ferrite microconstituents in steels is a significant challenge.
  • Manual point counting using optical and scanning electron microscopy (SEM) is common but tedious, time-consuming, and prone to operator bias.
  • Existing classification systems struggle with complex steel microstructures.

Purpose of the Study:

  • To present a novel automated technique for identifying and quantifying complex ferrite microstructures in steels.
  • To overcome the limitations of manual point counting methods.
  • To improve the accuracy and efficiency of steel microstructure characterization.

Main Methods:

  • Utilized electron backscatter diffraction (EBSD) for automated analysis.
  • Leveraged preferential grain boundary misorientations, aspect ratios, and mean misorientation of ferrite classes as identification criteria.
  • Integrated grain size data to determine area fractions.

Main Results:

  • The automated EBSD technique demonstrated effective identification and quantification of ferrite microconstituents.
  • Results were validated by comparison with traditional point counting methods.
  • The technique showed high accuracy and efficiency in characterizing complex microstructures.

Conclusions:

  • The developed automated EBSD technique provides a reliable and efficient solution for ferrite microstructure characterization in steels.
  • This method significantly reduces the time and operator bias associated with traditional analysis.
  • The technique is adaptable for analyzing various other steel microstructures.