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Design of optical notch filters using apodized thickness modulation
Applied Optics
|February 12, 2014
Summary
This study introduces an apodized thickness design method for discrete layer notch filters, creating error-tolerant designs with minimal passband ripple. The method shows good agreement between theoretical and experimental results, demonstrating low sensitivity to deposition errors.
Area of Science:
- Optical Engineering
- Materials Science
Background:
- Discrete layer notch filters are crucial optical components.
- Achieving low ripple and error tolerance in filter design is challenging.
- Traditional methods often require extensive numerical optimization.
Purpose of the Study:
- To present an apodized thickness design method for discrete layer notch filters.
- To demonstrate error tolerance and low passband ripple without numerical optimization.
- To validate the design method through theoretical and experimental analysis.
Main Methods:
- Utilizing apodization functions (Gaussian, cosine squared, quintic) for thickness design.
- Fabricating single-notch and multi-notch filters using ion beam deposition.
- Comparing theoretical designs with experimental measurements.
Main Results:
- The apodized design method yields filters with low ripple in passband regions.
- Experimental results show good agreement with theoretical predictions.
- The designs exhibit low sensitivity to layer thickness errors during deposition.
Conclusions:
- The proposed apodized thickness design method is effective for discrete layer notch filters.
- The method offers inherent error tolerance, simplifying the fabrication process.
- Apodized designs are robust against variations in the deposition process.
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