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Sample corrugation affects the apparent bond lengths in atomic force microscopy.

Mark P Boneschanscher1, Sampsa K Hämäläinen, Peter Liljeroth

  • 1Debye Institute for Nanomaterials Science, Utrecht University , P.O. Box 80000, 3508TA Utrecht, The Netherlands.

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Summary
This summary is machine-generated.

Atomic force microscopy (AFM) with carbon monoxide (CO) tips can image molecular structures. However, CO tip flexibility causes apparent atomic positions to shift, limiting bond length accuracy in AFM imaging.

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Area of Science:

  • Surface Science
  • Atomic Force Microscopy
  • Chemical Physics

Background:

  • Frequency modulation atomic force microscopy (AFM) achieves atomic resolution for planar molecules.
  • Carbon monoxide (CO)-terminated tips are commonly used in constant-height mode AFM.
  • The flexibility of the CO molecule on the tip can influence measurement outcomes.

Purpose of the Study:

  • To investigate how CO tip flexibility affects AFM measurements of atomic positions.
  • To understand the impact of sample corrugation on apparent atomic positions in AFM.
  • To determine the limitations imposed by tip-sample interactions on bond length accuracy.

Main Methods:

  • Experimental AFM measurements using epitaxial graphene as a model system.
  • Molecular mechanics simulations to model tip-sample interactions.
  • Analysis of the interplay between CO bending and background signals.

Main Results:

  • Apparent atomic positions in AFM images are dependent on sample corrugation.
  • CO tip bending and nonlinear background signals significantly influence measurements.
  • These effects are sensitive to tip-sample distance, impacting accuracy.

Conclusions:

  • The flexibility of CO-terminated AFM tips introduces artifacts in atomic position determination.
  • Accurate bond length measurements using AFM are limited by tip-sample interactions and tip flexibility.
  • Further refinement of AFM techniques is needed for precise molecular structure analysis.