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Fabricating van der Waals Heterostructures with Precise Rotational Alignment
Published on: July 5, 2019
Second harmonic generation from artificially stacked transition metal dichalcogenide twisted bilayers
Wei-Ting Hsu1, Zi-Ang Zhao, Lain-Jong Li
1Department of Electrophysics, National Chiao Tung University , Hsinchu 30010, Taiwan.
Optical second harmonic generation (SHG) probes crystalline symmetry in transition metal dichalcogenides (TMDs). This study explores SHG in twisted TMD bilayers, revealing its potential for characterizing stacking orientation and crystal polarity in van der Waals heterostructures.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Optical second harmonic generation (SHG) is a sensitive technique for probing crystalline symmetry.
- Previous SHG studies on few-layer transition metal dichalcogenides (TMDs) primarily focused on ideal Bernal stacking.
- SHG in non-ideally stacked TMD structures remains largely unexplored.
Purpose of the Study:
- To investigate SHG in twisted homo- and heterostructural TMD bilayers with arbitrary stacking angles.
- To demonstrate the application of SHG for characterizing stacking orientation, crystal polarity, and domain boundaries in van der Waals heterostructures.
- To establish SHG as an efficient, sensitive, and nondestructive characterization method.
Main Methods:
- Fabrication of twisted TMD bilayers through artificial stacking.
- Measurement and analysis of optical second harmonic generation (SHG) signals.
- Polarization-resolved SHG spectroscopy to probe structural properties.
Main Results:
- SHG from twisted TMD bilayers results from coherent superposition of SH fields from individual layers.
- The interference pattern in SHG is dependent on the stacking angle and independent of constituent materials.
- SHG successfully probed domain boundaries and crystal polarity in mirror twins of chemically grown TMDs.
Conclusions:
- SHG is a versatile tool for analyzing stacking configurations in van der Waals heterostructures.
- The interference effect in SHG provides a sensitive measure of stacking angle and material interfaces.
- SHG offers a nondestructive method for detailed characterization of complex layered materials.
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