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Updated: May 2, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Akihiro Suzuki1, Shin Furutaku1, Kei Shimomura1
1Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
We demonstrate hard X-ray ptychography with a multislice approach, achieving ~50 nm resolution for layered objects. This overcomes limitations of the projection approximation for advanced imaging.
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Published on: October 24, 2019
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