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A very low noise, high accuracy, programmable voltage source for low frequency noise measurements
Graziella Scandurra1, Gino Giusi1, Carmine Ciofi1
1Dipartimento di Ingegneria Elettronica, Chimica e Ingegneria Industriale Contrada di Dio, 98166 Messina, Italy.
This study introduces a programmable voltage source for low-frequency noise measurements. It achieves very low noise and high accuracy by using a supercapacitor filter and a novel circuit topology to compensate for leakage currents.
Area of Science:
- Electrical Engineering
- Instrumentation and Measurement
Background:
- Accurate low-frequency noise measurements require stable, low-noise voltage sources.
- Standard digital-to-analog converters (DACs) introduce noise that can corrupt sensitive measurements.
- Supercapacitors offer filtering benefits but suffer from leakage currents causing DC errors.
Purpose of the Study:
- To design a programmable voltage source with very low noise and high accuracy for low-frequency noise measurements.
- To overcome the DC error limitations caused by supercapacitor leakage currents.
- To achieve noise levels comparable to high-quality operational amplifiers.
Main Methods:
- Implementation of a supercapacitor-based two-pole low-pass filter to attenuate DAC noise below 100 mHz.
- Development of a specialized circuit topology to mitigate DC errors from supercapacitor leakage.
- Utilizing an OP27 operational amplifier as an output buffer for low noise performance.
Main Results:
- Achieved output noise levels as low as the equivalent input voltage noise of the OP27 operational amplifier.
- Demonstrated DC accuracy better than 0.05% up to an 8 V output.
- Verified performance through SPICE simulations and prototype measurements.
Conclusions:
- The proposed voltage source design effectively provides a low-noise, high-accuracy biasing solution for low-frequency measurements.
- The developed circuit topology successfully compensates for supercapacitor leakage, enabling high DC accuracy.
- The system's stabilization time is compatible with the long measurement durations required for low-frequency noise analysis.
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