Related Experiment Video
Updated: Apr 30, 2026

Improving High Viscosity Extrusion of Microcrystals for Time-resolved Serial Femtosecond Crystallography at X-ray Lasers
Published on: February 28, 2019
Science opportunities at the SwissFEL X-ray Laser
Bruce D Patterson1, Paul Beaud1, Hans H Braun1
1SwissFEL Paul Scherrer Institute OVGA 413 CH-5232 Villigen-PSI, Switzerland.
Abstract:
Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.

