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Published on: January 23, 2013
Tunable antireflection from conformal Al-doped ZnO films on nanofaceted Si templates
Tanmoy Basu1, Mohit Kumar1, Pratap Kumar Sahoo2
1Institute of Physics, Sachivalaya Marg, Bhubaneswar 751005, India.
Abstract:
Photon harvesting by reducing reflection loss is the basis of photovoltaic devices. Here, we show the efficacy of Al-doped ZnO (AZO) overlayer on ion beam-synthesized nanofaceted silicon for suppressing reflection loss. In particular, we demonstrate thickness-dependent tunable antireflection (AR) from conformally grown AZO layer, showing a systematic shift in the reflection minima from ultraviolet to visible to near-infrared ranges with increasing thickness. Tunable AR property is understood in light of depth-dependent refractive index of nanofaceted silicon and AZO overlayer. This improved AR property significantly increases the fill factor of such textured heterostructures, which reaches its maximum for 60-nm AZO compared to the ones based on planar silicon. This thickness matches with the one that shows the maximum reduction in surface reflectance.
Pacs:
81.07.-b; 42.79.Wc; 81.16.Rf; 81.15.Cd.
