Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.1K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Sliding friction over individual aromatic bonds correlates with bond order.

Nature communications·2026
Same author

Atomic-Scale Optical Microscopy with Continuous-Wave Mid-Infrared Radiation.

Nano letters·2026
Same author

Atomic Manipulation on a Highly Corrugated Topological Insulator.

Physical review letters·2025
Same author

Combining Electrochemical Scanning Tunneling Microscopy with Force Microscopy.

ACS nano·2025
Same author

Janus graphene nanoribbons with localized states on a single zigzag edge.

Nature·2025
Same author

Decoding the surface of a complex oxide.

Science (New York, N.Y.)·2024
Same journal

Erratum: Bacterial Turbulence at Compressible Fluid Interfaces [Phys. Rev. Lett. 136, 138301 (2026)].

Physical review letters·2026
Same journal

Unveiling Light-Quark Yukawa Flavor Structure via Dihadron Fragmentation at Lepton Colliders.

Physical review letters·2026
Same journal

Adaptable Route to Fast Coherent State Transport via Bang-Bang-Bang Protocols.

Physical review letters·2026
Same journal

Topological Transition and Emergence of Elasticity of Dislocation in Skyrmion Lattice: Beyond Kittel's Magnetic-Polar Analogy.

Physical review letters·2026
Same journal

Pound-Drever-Hall Method for Superconducting-Qubit Readout.

Physical review letters·2026
Same journal

Coupling a ^{73}Ge Nuclear Spin to an Electrostatically Defined Quantum Dot in Silicon.

Physical review letters·2026
See all related articles

Related Experiment Video

Updated: Apr 30, 2026

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

6.8K

CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces.

Maximilian Schneiderbauer1, Matthias Emmrich1, Alfred J Weymouth1

  • 1Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany.

Physical Review Letters
|May 13, 2014
PubMed
Summary
This summary is machine-generated.

Investigating copper nitride (Cu2N) islands on copper using microscopy, researchers found that tip properties significantly alter surface imaging. This reveals the crucial role of electrostatic forces in atomic contrast on polar surfaces.

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

1.3K
Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

11.7K

Related Experiment Videos

Last Updated: Apr 30, 2026

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
10:06

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy

Published on: July 10, 2019

6.8K
High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

1.3K
Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

11.7K

Area of Science:

  • Surface Science
  • Materials Science
  • Nanotechnology

Background:

  • Insulating copper nitride (Cu2N) islands on Cu(100) surfaces present imaging challenges.
  • Understanding atomic-level interactions is crucial for nanoscale material characterization.

Purpose of the Study:

  • To investigate the atomic structure and imaging of Cu2N islands on Cu(100).
  • To explore the influence of different scanning probe microscopy tips on surface contrast.

Main Methods:

  • Combined scanning tunneling microscopy (STM) and noncontact atomic force microscopy (nc-AFM).
  • Utilized both bare metal and CO-terminated tips for AFM imaging.
  • Employed STM data analysis based on Choi, Ruggiero, and Gupta for atomic position identification.

Main Results:

  • AFM imaging with different tips exhibited inverted contrast over Cu2N islands.
  • STM successfully identified atomic positions on the Cu2N islands.
  • An electrostatic model explained the observed inverted contrast, attributing it to tip dipole moments.

Conclusions:

  • Tip characteristics, specifically their dipole moments, critically influence atomic contrast on polar surfaces.
  • Short-range electrostatic forces are vital for achieving atomic resolution in nc-AFM of polar materials.
  • This study provides insights into advanced surface characterization techniques.