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Updated: Apr 28, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
A novel von Hamos spectrometer for efficient X-ray emission spectroscopy in the laboratory
Lars Anklamm1, Christopher Schlesiger1, Wolfgang Malzer1
1Institute for Optic and Atomic Physics, Technical University Berlin, Hardenbergstr. 36, 10623 Berlin, Germany.
Abstract:
We present a novel, highly efficient von Hamos spectrometer for X-ray emission spectroscopy (XES) in the laboratory using highly annealed pyrolitic graphite crystals as the dispersive element. The spectrometer covers an energy range from 2.5 keV to 15 keV giving access to chemical speciation and information about the electronic configuration of 3d transition metals by means of the Kβ multiplet. XES spectra of Ti compounds are presented to demonstrate the speciation capabilities of the instrument. A spectral resolving power of E/ΔE = 2000 at 8 keV was achieved. Typical acquisition times range from 10 min for bulk material to hours for thin samples below 1 μm.
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