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Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Michael J Schrapp1, Gabor T Herman2
1Siemens AG, CT Munich, Germany and Physics Department E21, Technical University of Munich, Munich, Germany.
Industrial non-destructive testing using X-ray computed tomography (CT) struggles with large objects. A new superiorization method integrates complementary data to enhance CT image quality and precisely localize edges not visible with CT alone.
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