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An induction method to calculate the complex permeability of soft magnetic films without a reference sample
Jinwu Wei1, Jianbo Wang1, Qingfang Liu1
1Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, People's Republic of China.
A novel electromagnetic induction method accurately measures complex permeability spectra of magnetic thin films without a reference sample. This technique offers enhanced sensitivity and a broader frequency range compared to existing methods.
Area of Science:
- Materials Science
- Electromagnetism
- Thin Film Analysis
Background:
- Accurate characterization of magnetic properties is crucial for advanced materials.
- Existing methods for measuring complex permeability often require reference samples and have limitations in sensitivity or frequency band.
Purpose of the Study:
- To develop a new analytical method for calculating complex permeability spectra.
- To achieve higher sensitivity and a wider frequency band compared to conventional techniques.
- To validate the method's accuracy using magnetic thin films.
Main Methods:
- Utilizing an electromagnetic induction principle with a short-circuited microstrip line jig.
- Calculating complex permeability spectra without a known reference sample.
- Measuring magnetic thin films with in-plane uniaxial anisotropy.
Main Results:
- The proposed method demonstrates higher sensitivity and a wider frequency band than coplanar waveguide and pick-up coil methods.
- Experimental results for magnetic thin films show complex permeability spectra in good agreement with theoretical analysis.
- Measured permeability values were verified against initial susceptibility, with less than 5% difference.
Conclusions:
- The short-circuited microstrip line induction method provides an accurate and efficient way to determine complex permeability spectra.
- This technique eliminates the need for reference samples, simplifying magnetic thin film characterization.
- The method's performance is suitable for analyzing magnetic thin films with uniaxial anisotropy.
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