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Abnormal coexistence of unipolar, bipolar, and threshold resistive switching in an Al/NiO/ITO structure

Xin-Cai Yuan1, Jin-Long Tang2, Hui-Zhong Zeng3

  • 1State Key Laboratory Cultivation Base for Nonmetal Composites and Functional Materials, Southwest University of Science and Technology, Mianyang 621010, People's Republic of China.

Nanoscale Research Letters
|June 19, 2014
PubMed

Keywords:
Indium tin oxide substrateInterfaceResistive switchingThin film

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